説明
Zygo Verifire Bow and Warp構成
構成なしOEMモデルの説明
The Verifire™ Laser Interferometer is a metrology system that provides fast and reliable measurements of surface form error, and transmitted wavefront of optical components, systems, and assemblies. The Verifire™ interferometer system is a true laser Fizeau design that expands upon ZYGO’s unmatched experience in surface form metrology. The system uses a ZYGO-manufactured HeNe laser source combined with ZYGO’s patented acquisition algorithms and full-featured Mx™ metrology software to enable high-precision metrology with easy-to-use analysis capabilities. This makes the Verifire™ Laser Interferometer an essential tool for any optics shop looking to achieve the highest levels of precision and accuracy in their measurements.ドキュメント
ドキュメントなし
ZYGO
VERIFIRE
検証済み
カテゴリ
Metrology
最終検証： 4日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
82702
ウェーハサイズ：
6"/150mm
ヴィンテージ：
2015
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZYGO
VERIFIRE
カテゴリ
Metrology
最終検証： 4日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
82702
ウェーハサイズ：
6"/150mm
ヴィンテージ：
2015
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Zygo Verifire Bow and Warp構成
構成なしOEMモデルの説明
The Verifire™ Laser Interferometer is a metrology system that provides fast and reliable measurements of surface form error, and transmitted wavefront of optical components, systems, and assemblies. The Verifire™ interferometer system is a true laser Fizeau design that expands upon ZYGO’s unmatched experience in surface form metrology. The system uses a ZYGO-manufactured HeNe laser source combined with ZYGO’s patented acquisition algorithms and full-featured Mx™ metrology software to enable high-precision metrology with easy-to-use analysis capabilities. This makes the Verifire™ Laser Interferometer an essential tool for any optics shop looking to achieve the highest levels of precision and accuracy in their measurements.ドキュメント
ドキュメントなし