説明
Good working condition No missing parts Accessories: ・Differential interference: DIC slider ・Analyzer (L2-RAN) ・Polarizer (L2-PO) ・Press guard/with anti-vibration stand Capable of 6in stage travel Metric micrometer digital micrometer Ocular viewing Not inverted構成
Power supply: 1 phase 100V 50/60Hz Light source: PSM-11520 Eyepiece: CFIUW10x/25 Objective lens: LUPlan5x/10x/20x/50x/100x Stage: 8×8 stage Stroke: 150×150mm Compatible wafer: 8 inches Revolver: automaticOEMモデルの説明
The Eclipse L200A has scored major advances in the standardization of inspection and safeguards against contamination. In a new design that combines motorized control with automated operation, observation conditions can be programmed for each individual objective or for each substrate to be inspected. Focus position, objective magnification, illumination control and other microscope methods are fully programmable and can be recalled instantly. This eliminates deviation in inspection results that might occur due to different settings made by multiple users. To minimize the chance of contamination, the L200A's aperture control and other major operations are now motorized, enabling remote control for use on unattended IC production lines. Like other Eclipseseries microscopes from Nikon, the L200A features industry-acclaimed CFI60 infinity optics. Include an ergonomic design for comfortable viewing, a rigid, vibration resistant constmction, and you have a microscope unsurpassed to meet the stringent requirements of the latest semiconductor fabs The L200A is the next step upward in automated IC inspection microscopy.ドキュメント
ドキュメントなし
NIKON
ECLIPSE L200
検証済み
カテゴリ
Microscope
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
105027
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
NIKON
ECLIPSE L200
カテゴリ
Microscope
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
105027
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Good working condition No missing parts Accessories: ・Differential interference: DIC slider ・Analyzer (L2-RAN) ・Polarizer (L2-PO) ・Press guard/with anti-vibration stand Capable of 6in stage travel Metric micrometer digital micrometer Ocular viewing Not inverted構成
Power supply: 1 phase 100V 50/60Hz Light source: PSM-11520 Eyepiece: CFIUW10x/25 Objective lens: LUPlan5x/10x/20x/50x/100x Stage: 8×8 stage Stroke: 150×150mm Compatible wafer: 8 inches Revolver: automaticOEMモデルの説明
The Eclipse L200A has scored major advances in the standardization of inspection and safeguards against contamination. In a new design that combines motorized control with automated operation, observation conditions can be programmed for each individual objective or for each substrate to be inspected. Focus position, objective magnification, illumination control and other microscope methods are fully programmable and can be recalled instantly. This eliminates deviation in inspection results that might occur due to different settings made by multiple users. To minimize the chance of contamination, the L200A's aperture control and other major operations are now motorized, enabling remote control for use on unattended IC production lines. Like other Eclipseseries microscopes from Nikon, the L200A features industry-acclaimed CFI60 infinity optics. Include an ergonomic design for comfortable viewing, a rigid, vibration resistant constmction, and you have a microscope unsurpassed to meet the stringent requirements of the latest semiconductor fabs The L200A is the next step upward in automated IC inspection microscopy.ドキュメント
ドキュメントなし