説明
metallographic microscope構成
1. Eyepiece: SWN 10X 2. Observation tube: three-eye observation tube 3. Nose wheel: 5-hole manual nose wheel 4. Upper light source lamp house 5. Bright and dark vision body, objective lens: 5XBD , 10XBD , 20XBD , 50XBD 6. CCD adapter mirror 7. Mobile bed: 6X6 STAGEOEMモデルの説明
The OPTIPHOT 150 series is equipped with Nikon's CF Infinity Corrected Optical System, the new Universal Epi-illuminator 10 for pinhole illumination brightfield, darkfield, DIC (Differential Interference Contrast) and epi-fluorescence observations, and a rigid frame that was designed using CAE structural analysis. The OPTIPHOT 150 series offers superior high-magnification observation compared with conventional microscopes and enables inspection of highly integrated wafers.ドキュメント
ドキュメントなし
NIKON
OPTIPHOT 150
検証済み
カテゴリ
Microscope
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
74560
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
NIKON
OPTIPHOT 150
カテゴリ
Microscope
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
74560
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
metallographic microscope構成
1. Eyepiece: SWN 10X 2. Observation tube: three-eye observation tube 3. Nose wheel: 5-hole manual nose wheel 4. Upper light source lamp house 5. Bright and dark vision body, objective lens: 5XBD , 10XBD , 20XBD , 50XBD 6. CCD adapter mirror 7. Mobile bed: 6X6 STAGEOEMモデルの説明
The OPTIPHOT 150 series is equipped with Nikon's CF Infinity Corrected Optical System, the new Universal Epi-illuminator 10 for pinhole illumination brightfield, darkfield, DIC (Differential Interference Contrast) and epi-fluorescence observations, and a rigid frame that was designed using CAE structural analysis. The OPTIPHOT 150 series offers superior high-magnification observation compared with conventional microscopes and enables inspection of highly integrated wafers.ドキュメント
ドキュメントなし