説明
Option: Lumenera Infinity 2-3C, 3.3 megapixel Digital CCD Camera with PC and software構成
300mm reflected light microscope 12x12 xy stage with coaxial controls  (Can accept XY stage up to 24"x24") configured for brightfield and darkfield inspection front mounted controls for light intensity 3 position cube slider for BF/DF/optional DIC Integrated motorized aperture stop RS-232C interface for PC data export MX-SWETTR Ultrawidefield tilting observation head super widefield SWH10x-H/26.5 eyepieces 5x/0.15 UM Plan BD objective 10x/0.30 UM Plan BD objective 20x/0.40 LM Plan BD objective 50x//0.50 LM Plan BD objective 100x/0.80 LM Plan BD objective Motorized nosepiece rotation U-25ND25 filterOEMモデルの説明
The Olympus MX61L is a microscope designed for inspecting semiconductors with a 300mm frame. It offers high-quality imaging through various observation techniques, including brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. This microscope is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution and is an extended frame version of the MX61 microscope, capable of handling 300mm wafers and flat panels up to 24x24 inches.ドキュメント
ドキュメントなし
OLYMPUS
MX61L
検証済み
カテゴリ
Microscope
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
24292
ウェーハサイズ：
12"/300mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
OLYMPUS
MX61L
カテゴリ
Microscope
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
24292
ウェーハサイズ：
12"/300mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Option: Lumenera Infinity 2-3C, 3.3 megapixel Digital CCD Camera with PC and software構成
300mm reflected light microscope 12x12 xy stage with coaxial controls  (Can accept XY stage up to 24"x24") configured for brightfield and darkfield inspection front mounted controls for light intensity 3 position cube slider for BF/DF/optional DIC Integrated motorized aperture stop RS-232C interface for PC data export MX-SWETTR Ultrawidefield tilting observation head super widefield SWH10x-H/26.5 eyepieces 5x/0.15 UM Plan BD objective 10x/0.30 UM Plan BD objective 20x/0.40 LM Plan BD objective 50x//0.50 LM Plan BD objective 100x/0.80 LM Plan BD objective Motorized nosepiece rotation U-25ND25 filterOEMモデルの説明
The Olympus MX61L is a microscope designed for inspecting semiconductors with a 300mm frame. It offers high-quality imaging through various observation techniques, including brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. This microscope is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution and is an extended frame version of the MX61 microscope, capable of handling 300mm wafers and flat panels up to 24x24 inches.ドキュメント
ドキュメントなし