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UNION HISOMET II
    説明
    Union Hisomet-II Measuring Microscope * Installed in Clean-room.
    構成
    構成なし
    OEMモデルの説明
    HISOMET-II is a non-contact depth measuring microscope that has been designed based on an optical type focal point detection system. Adopting precise focus indicator, it's possible to measure height, depth, steps, etc. with observing the surface of measuring point, by simply coinciding the halves of an index graticule. Since there are no concern for physical damages such as distortion, blow or nicks to a specimen because of non-contact system, HISOMET is optimum for measuring electronic components such as ICs or high-precision processing parts.
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    UNION

    HISOMET II

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    検証済み

    カテゴリ
    Microscope

    最終検証: 30日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    55839


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明

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    同様のリスト
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    UNION HISOMET II

    UNION

    HISOMET II

    Microscope
    ヴィンテージ: 0状態: 中古
    最終確認30日以上前

    UNION

    HISOMET II

    verified-listing-icon
    検証済み
    カテゴリ
    Microscope
    最終検証: 30日以上前
    listing-photo-1bc9361ffa3443e893efff90726b5d99-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/1bc9361ffa3443e893efff90726b5d99/ea123a55bfc949cca51858caeecc7d43_spk3251_mw.jpg
    listing-photo-1bc9361ffa3443e893efff90726b5d99-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/1bc9361ffa3443e893efff90726b5d99/9609c5c6aec44870974f7ed85dccceec_spk3250_mw.jpg
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    55839


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Union Hisomet-II Measuring Microscope * Installed in Clean-room.
    構成
    構成なし
    OEMモデルの説明
    HISOMET-II is a non-contact depth measuring microscope that has been designed based on an optical type focal point detection system. Adopting precise focus indicator, it's possible to measure height, depth, steps, etc. with observing the surface of measuring point, by simply coinciding the halves of an index graticule. Since there are no concern for physical damages such as distortion, blow or nicks to a specimen because of non-contact system, HISOMET is optimum for measuring electronic components such as ICs or high-precision processing parts.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    UNION HISOMET II

    UNION

    HISOMET II

    Microscopeヴィンテージ: 0状態: 中古最終検証: 30日以上前
    UNION HISOMET II

    UNION

    HISOMET II

    Microscopeヴィンテージ: 0状態: 中古最終検証: 60日以上前
    UNION HISOMET II

    UNION

    HISOMET II

    Microscopeヴィンテージ: 2004状態: 中古最終検証: 60日以上前