説明
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.構成
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.OEMモデルの説明
提供なしドキュメント
ドキュメントなし
カテゴリ
Overlay
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Deinstalled / Crated
製品ID：
132024
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ASML
YieldStar S-200B
カテゴリ
Overlay
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Deinstalled / Crated
製品ID：
132024
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.構成
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.OEMモデルの説明
提供なしドキュメント
ドキュメントなし