説明
Main electronics controller Missing Prober top section (robot + sensors + optical alignment) Missing Chuck / platen Likely missing or partially present Test head docking ring Present (lower section) Wafer cassette elevator (right) Present Power modules & pneumatics Some present Side/top covers Partially included - at least one Automatically loads wafers from FOUP/cassette Moves wafer into position under a thermal or electrical test head Provides X/Y/Z/Theta precision alignment Interfaces with ATE systems for: wafer acceptance testing burn-in reliability stress testing (HTOL / LTOL / cycling) parametric wafer probe It is a very high-precision electromechanical platform used in semiconductor fabs (Intel, TSMC, Samsung, Altera—the label confirms Altera owned this one).構成
構成なしOEMモデルの説明
提供なしドキュメント
ドキュメントなし
カテゴリ
Parts
最終検証： 13日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
150385
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
TEL / TOKYO ELECTRON
4072A
カテゴリ
Parts
最終検証： 13日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
150385
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Main electronics controller Missing Prober top section (robot + sensors + optical alignment) Missing Chuck / platen Likely missing or partially present Test head docking ring Present (lower section) Wafer cassette elevator (right) Present Power modules & pneumatics Some present Side/top covers Partially included - at least one Automatically loads wafers from FOUP/cassette Moves wafer into position under a thermal or electrical test head Provides X/Y/Z/Theta precision alignment Interfaces with ATE systems for: wafer acceptance testing burn-in reliability stress testing (HTOL / LTOL / cycling) parametric wafer probe It is a very high-precision electromechanical platform used in semiconductor fabs (Intel, TSMC, Samsung, Altera—the label confirms Altera owned this one).構成
構成なしOEMモデルの説明
提供なしドキュメント
ドキュメントなし