説明
This is a UF200 with 6/8 inch SMIF elevator, nickel hot chuck, round ceramic cleaning, no automatic probe card change. In 2006 it received a low noise upgrade and a hardware upgrade for new software management. The plate had been modified to accommodate the Eagle card holder with manual PC loading.構成
Category: Probers Loader: 8 Chuck Type: Hot Temperature Range: +30/150 Chiller: NAOEMモデルの説明
The Accretech UF200 Wafer probing machine is a highly advanced tool with a capacity of 2000 pins. It utilizes Moire scale in the AC servo motor closed-loop control system to achieve fast and precise positioning, boasting a stage accuracy of 2 µm. This machine represents a significant advancement in wafer probing technology, offering users efficient and accurate performance for their probing needs.ドキュメント
ドキュメントなし
ACCRETECH / TSK
UF200
検証済み
カテゴリ
Probers
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
109900
ウェーハサイズ:
8"/200mm
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示ACCRETECH / TSK
UF200
カテゴリ
Probers
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
109900
ウェーハサイズ:
8"/200mm
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
This is a UF200 with 6/8 inch SMIF elevator, nickel hot chuck, round ceramic cleaning, no automatic probe card change. In 2006 it received a low noise upgrade and a hardware upgrade for new software management. The plate had been modified to accommodate the Eagle card holder with manual PC loading.構成
Category: Probers Loader: 8 Chuck Type: Hot Temperature Range: +30/150 Chiller: NAOEMモデルの説明
The Accretech UF200 Wafer probing machine is a highly advanced tool with a capacity of 2000 pins. It utilizes Moire scale in the AC servo motor closed-loop control system to achieve fast and precise positioning, boasting a stage accuracy of 2 µm. This machine represents a significant advancement in wafer probing technology, offering users efficient and accurate performance for their probing needs.ドキュメント
ドキュメントなし