説明
説明なし構成
Tri-temp DD for 93K Prober 12” NICKEL PLATE Cold LC4 Chuck (-55~200C) Type 6 OCR Air Blow option Cleaning plate Dew Point Sensor Air dryer ARTS-HS3 ChillerOEMモデルの説明
The UF3000EX-e is a fully automatic wafer prober that is also available for numerous special applications. It is uncompromising for throughput, very flexible for application, and has very precise navigation. It uses non-contact measurement and can handle wafers from 200 to 300 mm in diameter, including special types of wafers. The UF3000EX-e features a newly developed XY stage drive unit and a new algorithm for extremely high throughput, an improved Z-platform for the highest probe power, and a 15-inch LCD touch screen for easy operation. It also has an Optical Target Scope (OTS) for very precise measurements of the relative positions of probe cards and chucks, a tri-color 3-level magnifying function for color recording and 3 enhancement levels, and a navigation display function that allows the user to manage each desired wafer point by simply touching the wafer map.ドキュメント
ドキュメントなし
カテゴリ
Probers
最終検証： 9日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
142210
ウェーハサイズ：
不明
ヴィンテージ：
2021
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
ACCRETECH / TSK
UF3000EX-e
カテゴリ
Probers
最終検証： 9日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
142210
ウェーハサイズ：
不明
ヴィンテージ：
2021
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
Tri-temp DD for 93K Prober 12” NICKEL PLATE Cold LC4 Chuck (-55~200C) Type 6 OCR Air Blow option Cleaning plate Dew Point Sensor Air dryer ARTS-HS3 ChillerOEMモデルの説明
The UF3000EX-e is a fully automatic wafer prober that is also available for numerous special applications. It is uncompromising for throughput, very flexible for application, and has very precise navigation. It uses non-contact measurement and can handle wafers from 200 to 300 mm in diameter, including special types of wafers. The UF3000EX-e features a newly developed XY stage drive unit and a new algorithm for extremely high throughput, an improved Z-platform for the highest probe power, and a 15-inch LCD touch screen for easy operation. It also has an Optical Target Scope (OTS) for very precise measurements of the relative positions of probe cards and chucks, a tri-color 3-level magnifying function for color recording and 3 enhancement levels, and a navigation display function that allows the user to manage each desired wafer point by simply touching the wafer map.ドキュメント
ドキュメントなし