説明
説明なし構成
Docked Tester: TS6700 OS: S8.39.FC Hinge Model: MHF6000EX Auto Card Change: Include Chuck Type: Nickel/Hot Chuck Temp: 30℃～150℃ Cleaning Unit: Include Tester I/F: GPIB OCR: 0 Inker: 0 Ethernet: 0 Initialization: 0 Missing/Defective: NoneOEMモデルの説明
The ACCRETECH / TSK UF3000LX is a probing machine that performs electrical tests of each chip on a wafer, ensuring the quality of semiconductor devices. It is a prober with high-speed probing that targets non-memory devices. High-speed and low-vibration are achieved by adopting the newly developed exclusive XY driving system. Compared with existing products, it has a smaller footprint due to design changes and has reduced power consumption by 10% in consideration for the environment.ドキュメント
ドキュメントなし
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
121090
ウェーハサイズ：
不明
ヴィンテージ：
2018
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
ACCRETECH / TSK
UF3000LX
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
121090
ウェーハサイズ：
不明
ヴィンテージ：
2018
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
Docked Tester: TS6700 OS: S8.39.FC Hinge Model: MHF6000EX Auto Card Change: Include Chuck Type: Nickel/Hot Chuck Temp: 30℃～150℃ Cleaning Unit: Include Tester I/F: GPIB OCR: 0 Inker: 0 Ethernet: 0 Initialization: 0 Missing/Defective: NoneOEMモデルの説明
The ACCRETECH / TSK UF3000LX is a probing machine that performs electrical tests of each chip on a wafer, ensuring the quality of semiconductor devices. It is a prober with high-speed probing that targets non-memory devices. High-speed and low-vibration are achieved by adopting the newly developed exclusive XY driving system. Compared with existing products, it has a smaller footprint due to design changes and has reduced power consumption by 10% in consideration for the environment.ドキュメント
ドキュメントなし