説明
Fully Automatic Prober with an inker構成
Manufacturer: Electroglas Model: Horizon 4085X Type: Fully Automatic Prober with an inker Version: 200 mm Condition: good Vintage: Jan 1998 Sale condition: as is where is Comments: Ce marked Dimensions: 160/180 Weight: 1000 kg Chuck has temperature control. TRANS Component Tag – Standard Has docking hardware to fit to an AGILENT Tech 4062 Parametric Tester E-Test Optem HF Video Microscope The prober is fitted with an inker, which marks bad dies during the inspection.OEMモデルの説明
The Electroglas Horizon 4085X Automatic Wafer Prober System is a precision manufacturing machine which moves wafer through the test process quickly, accurately, and safely. It is designed to probe high - pin - count devices, performing with high accuracy in an enclosed clean environment. Probing accuracy is certified to +/- 0.25 mil, required for probing small densely packed bond pads.ドキュメント
ドキュメントなし
MARTEK / ELECTROGLAS (EG)
HORIZON 4085X
検証済み
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
29016
ウェーハサイズ：
不明
ヴィンテージ：
1998
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
MARTEK / ELECTROGLAS (EG)
HORIZON 4085X
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
29016
ウェーハサイズ：
不明
ヴィンテージ：
1998
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Fully Automatic Prober with an inker構成
Manufacturer: Electroglas Model: Horizon 4085X Type: Fully Automatic Prober with an inker Version: 200 mm Condition: good Vintage: Jan 1998 Sale condition: as is where is Comments: Ce marked Dimensions: 160/180 Weight: 1000 kg Chuck has temperature control. TRANS Component Tag – Standard Has docking hardware to fit to an AGILENT Tech 4062 Parametric Tester E-Test Optem HF Video Microscope The prober is fitted with an inker, which marks bad dies during the inspection.OEMモデルの説明
The Electroglas Horizon 4085X Automatic Wafer Prober System is a precision manufacturing machine which moves wafer through the test process quickly, accurately, and safely. It is designed to probe high - pin - count devices, performing with high accuracy in an enclosed clean environment. Probing accuracy is certified to +/- 0.25 mil, required for probing small densely packed bond pads.ドキュメント
ドキュメントなし