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説明
Fully Automatic Prober with an inker構成
Manufacturer: Electroglas Model: Horizon 4085X Type: Fully Automatic Prober with an inker Version: 200 mm Condition: good Vintage: Jan 1998 Sale condition: as is where is Comments: Ce marked Dimensions: 160/180 Weight: 1000 kg Chuck has temperature control. TRANS Component Tag – Standard Has docking hardware to fit to an AGILENT Tech 4062 Parametric Tester E-Test Optem HF Video Microscope The prober is fitted with an inker, which marks bad dies during the inspection.OEMモデルの説明
The Electroglas Horizon 4085X Automatic Wafer Prober System is a precision manufacturing machine which moves wafer through the test process quickly, accurately, and safely. It is designed to probe high - pin - count devices, performing with high accuracy in an enclosed clean environment. Probing accuracy is certified to +/- 0.25 mil, required for probing small densely packed bond pads.ドキュメント
ドキュメントなし
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
29016
ウェーハサイズ：
不明
ヴィンテージ：
1998
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
MARTEK / ELECTROGLAS (EG)
HORIZON 4085X
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
29016
ウェーハサイズ：
不明
ヴィンテージ：
1998
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Fully Automatic Prober with an inker構成
Manufacturer: Electroglas Model: Horizon 4085X Type: Fully Automatic Prober with an inker Version: 200 mm Condition: good Vintage: Jan 1998 Sale condition: as is where is Comments: Ce marked Dimensions: 160/180 Weight: 1000 kg Chuck has temperature control. TRANS Component Tag – Standard Has docking hardware to fit to an AGILENT Tech 4062 Parametric Tester E-Test Optem HF Video Microscope The prober is fitted with an inker, which marks bad dies during the inspection.OEMモデルの説明
The Electroglas Horizon 4085X Automatic Wafer Prober System is a precision manufacturing machine which moves wafer through the test process quickly, accurately, and safely. It is designed to probe high - pin - count devices, performing with high accuracy in an enclosed clean environment. Probing accuracy is certified to +/- 0.25 mil, required for probing small densely packed bond pads.ドキュメント
ドキュメントなし