説明
The Electroglas 2001 wafer probers are extremely accurate, modularly designed automatic wafer probers, configured to perform automatic system functions of: Automatic wafer load Automatic wafer alignment Automatic wafer measurement Automatic wafer test/sort. The Electroglas 2001 prober ( EG 2001X, EG 2001CX ) wafer prober station may be seen in other configurations, including any of the following options: Autoalign Autoloader (material handling) Disk Drives & Controller Hot Chuck & Controller Ink Dot Inspection (an Autoalign option) OCR (optical character recognition) Probe Mark Inspection (an Autoalign option) Profiler (non-contact edge sensor)構成
構成なしOEMモデルの説明
Introducing the EG2001x Automatic Wafer Prober: Designed for semiconductor wafers, it handles 150mm wafers of silicon, glass, or polyimide-coated glass, with the option to use stainless steel, PEN on alumina, and other substrates. Automate loading, alignment, and probing of multiple wafer locations effortlessly. Additionally, it offers manual operation for added flexibility.ドキュメント
ドキュメントなし
カテゴリ
Probers
最終検証： 23日前
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
138389
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
MARTEK / ELECTROGLAS (EG)
EG2001X
カテゴリ
Probers
最終検証： 23日前
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
138389
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
The Electroglas 2001 wafer probers are extremely accurate, modularly designed automatic wafer probers, configured to perform automatic system functions of: Automatic wafer load Automatic wafer alignment Automatic wafer measurement Automatic wafer test/sort. The Electroglas 2001 prober ( EG 2001X, EG 2001CX ) wafer prober station may be seen in other configurations, including any of the following options: Autoalign Autoloader (material handling) Disk Drives & Controller Hot Chuck & Controller Ink Dot Inspection (an Autoalign option) OCR (optical character recognition) Probe Mark Inspection (an Autoalign option) Profiler (non-contact edge sensor)構成
構成なしOEMモデルの説明
Introducing the EG2001x Automatic Wafer Prober: Designed for semiconductor wafers, it handles 150mm wafers of silicon, glass, or polyimide-coated glass, with the option to use stainless steel, PEN on alumina, and other substrates. Automate loading, alignment, and probing of multiple wafer locations effortlessly. Additionally, it offers manual operation for added flexibility.ドキュメント
ドキュメントなし