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HITACHI N-6000
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    Model N-6000, which was co-developed by Renesas Technology Corp. and Hitachi, Ltd., has six tungsten manipulation-probes mounted on SEM (scanning electron microscope), each of which has a point with a 50-nm radius. Manipulation-probes on Model N-6000 can directly touch the contacts that lead to components of transistors: source, drain, gate, substrate, etc. Model N-6000 can directly measure metal-oxide semiconductor characteristics, like small current leaks, threshold voltage shifts, contact resistances, etc. Model N-6000 makes a bridge between logical electrical characterization and physical characterization, and helps failure locations to be identified. It dramatically improves the efficiency of failure analysis.
    ドキュメント

    ドキュメントなし

    HITACHI

    N-6000

    verified-listing-icon

    検証済み

    カテゴリ
    Probers

    最終検証: 30日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    74301


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    HITACHI N-6000

    HITACHI

    N-6000

    Probers
    ヴィンテージ: 0状態: 中古
    最終確認30日以上前

    HITACHI

    N-6000

    verified-listing-icon
    検証済み
    カテゴリ
    Probers
    最終検証: 30日以上前
    listing-photo-2e0a10d235ee49d09ae315cbcb0831e4-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    74301


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    Model N-6000, which was co-developed by Renesas Technology Corp. and Hitachi, Ltd., has six tungsten manipulation-probes mounted on SEM (scanning electron microscope), each of which has a point with a 50-nm radius. Manipulation-probes on Model N-6000 can directly touch the contacts that lead to components of transistors: source, drain, gate, substrate, etc. Model N-6000 can directly measure metal-oxide semiconductor characteristics, like small current leaks, threshold voltage shifts, contact resistances, etc. Model N-6000 makes a bridge between logical electrical characterization and physical characterization, and helps failure locations to be identified. It dramatically improves the efficiency of failure analysis.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    HITACHI N-6000

    HITACHI

    N-6000

    Probersヴィンテージ: 0状態: 中古最終検証:30日以上前
    HITACHI N-6000

    HITACHI

    N-6000

    Probersヴィンテージ: 200状態: 中古最終検証:60日以上前
    HITACHI N-6000

    HITACHI

    N-6000

    Probersヴィンテージ: 0状態: 中古最終検証:60日以上前