説明
FEATURES AND BENEFITS - Application flexibility for failure analysis, design and verification, parametric and functional tests - Precision and stability for submicron probing - Accommodates packaged parts and single chips as well as wafers and substrates - Configurations for measuring from attoAmpere level DC to 220 GHz high frequency - Low noise and frost-free measurements from –65°C to 400°C with the SUSS ProbeShield® - Interfaces to leading analysis instrumentation, optics, software and testers - ProberBench operating system, fully operable with or without a PC To Include: (1) Thermochuck 6in構成
- Karl Suss Joystick Controller & Power Supply, - Motorized Mitutoyo Microscope with Mitutoyo Objectives & Eye Piece - Motorized Chuck Platform - Optem Fiber & Illuminator, - Basler Scout IR Camera - Anti-vibration table - Karl Suss Manual High Frequency Probe Head & Arm (PH250HF) - 3units - Probe arm and probe head - 3units - XYZ Edmund Optic Micro Positioners- 1 unitOEMモデルの説明
The SUSS PA200 Semiautomatic Probe System is available as two versions, one for high speed (HS) and one for high resolution (HR) applications. They are both very stable, modular and flexible probe systems for wafers and substrates up to 200 mm (8).ドキュメント
ドキュメントなし
SUSS MicroTec / KARL SUSS
PA200
検証済み
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
64434
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
SUSS MicroTec / KARL SUSS
PA200
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
64434
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
FEATURES AND BENEFITS - Application flexibility for failure analysis, design and verification, parametric and functional tests - Precision and stability for submicron probing - Accommodates packaged parts and single chips as well as wafers and substrates - Configurations for measuring from attoAmpere level DC to 220 GHz high frequency - Low noise and frost-free measurements from –65°C to 400°C with the SUSS ProbeShield® - Interfaces to leading analysis instrumentation, optics, software and testers - ProberBench operating system, fully operable with or without a PC To Include: (1) Thermochuck 6in構成
- Karl Suss Joystick Controller & Power Supply, - Motorized Mitutoyo Microscope with Mitutoyo Objectives & Eye Piece - Motorized Chuck Platform - Optem Fiber & Illuminator, - Basler Scout IR Camera - Anti-vibration table - Karl Suss Manual High Frequency Probe Head & Arm (PH250HF) - 3units - Probe arm and probe head - 3units - XYZ Edmund Optic Micro Positioners- 1 unitOEMモデルの説明
The SUSS PA200 Semiautomatic Probe System is available as two versions, one for high speed (HS) and one for high resolution (HR) applications. They are both very stable, modular and flexible probe systems for wafers and substrates up to 200 mm (8).ドキュメント
ドキュメントなし