説明
TEL 30M0159 Prober dual load port構成
Software Version: Rby00-R014.083Z CIM: RS232 Process: Test Handler: Pincette Interface: FOUP Options: D250 ChilelrOEMモデルの説明
The P-12XL Prober is a next-generation prober developed by TEL. It builds on the success of the P-8XL and shares the same interactive LCD Touch Panel Screen and On-axis Alignment. Additionally, it incorporates a FOUP loader, increased Z force, and higher accuracy, making it capable of tackling tomorrow’s technological challenges. The P-12XL has even been featured in the Semiconductor International article “Fabrication of the First Transistors on 300mm Wafers.ドキュメント
ドキュメントなし
カテゴリ
Probers
最終検証： 3日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
147227
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
TEL / TOKYO ELECTRON
P-12XL
カテゴリ
Probers
最終検証： 3日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
147227
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
TEL 30M0159 Prober dual load port構成
Software Version: Rby00-R014.083Z CIM: RS232 Process: Test Handler: Pincette Interface: FOUP Options: D250 ChilelrOEMモデルの説明
The P-12XL Prober is a next-generation prober developed by TEL. It builds on the success of the P-8XL and shares the same interactive LCD Touch Panel Screen and On-axis Alignment. Additionally, it incorporates a FOUP loader, increased Z force, and higher accuracy, making it capable of tackling tomorrow’s technological challenges. The P-12XL has even been featured in the Semiconductor International article “Fabrication of the First Transistors on 300mm Wafers.ドキュメント
ドキュメントなし