説明
The Veeco FPP-5000 4-Point Probe simplifies the measurement of resistive properties of semiconductor wafers and resistive films. The electronics and probing mechanism is contained in a single compact package. The rugged cast aluminum housing assures mechanical integrity of the probe mechanism. The probing mechanism features a constant force probe head which is rigidly fixed in the housing. Unlike most four point probes and probing stations, which move the probe head into the wafer, the FPP- 5000 is designed so that the wafer is moved into the probe head. This insures constant probe force independent of operator force and wafer thickness.構成
構成なしOEMモデルの説明
提供なしドキュメント
ドキュメントなし
VEECO
FPP 5000
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
125374
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
The Veeco FPP-5000 4-Point Probe simplifies the measurement of resistive properties of semiconductor wafers and resistive films. The electronics and probing mechanism is contained in a single compact package. The rugged cast aluminum housing assures mechanical integrity of the probe mechanism. The probing mechanism features a constant force probe head which is rigidly fixed in the housing. Unlike most four point probes and probing stations, which move the probe head into the wafer, the FPP- 5000 is designed so that the wafer is moved into the probe head. This insures constant probe force independent of operator force and wafer thickness.構成
構成なしOEMモデルの説明
提供なしドキュメント
ドキュメントなし