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WYKO / VEECO NT2000
  • WYKO / VEECO NT2000
説明
説明なし
構成
Vertical resolution of a few angstrom over a wide area (5 X 5 mm2)
OEMモデルの説明
The WYKO NT2000 is an advanced optical profiler that provides ultra-precise 3-D analyses of surfaces for process control. It can measure heights from 0.1 nm to several millimeters, with vertical resolution as low as 0.1 nm. The fully automated system provides submicron precision and fast throughput, while non-automated versions are available for R&D applications. The instrument can accurately measure a wide variety of materials and is ideally suited for R&D investigation, quality inspection, failure analysis, and in-line production measurements.
ドキュメント

ドキュメントなし

verified-listing-icon

検証済み

カテゴリ
Profiler

最終検証: 60日以上前

主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

98586


ウェーハサイズ:

不明


ヴィンテージ:

不明


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

WYKO / VEECO

NT2000

verified-listing-icon
検証済み
カテゴリ
Profiler
最終検証: 60日以上前
listing-photo-c749e5435c8741b6801db974409f97e9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/47072/c749e5435c8741b6801db974409f97e9/ad1e779cde9248418d6bed57ee839567_1ce21dd7fb6d4fae8e16cf519f449b3c1201a_mw.jpeg
主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

98586


ウェーハサイズ:

不明


ヴィンテージ:

不明


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし
構成
Vertical resolution of a few angstrom over a wide area (5 X 5 mm2)
OEMモデルの説明
The WYKO NT2000 is an advanced optical profiler that provides ultra-precise 3-D analyses of surfaces for process control. It can measure heights from 0.1 nm to several millimeters, with vertical resolution as low as 0.1 nm. The fully automated system provides submicron precision and fast throughput, while non-automated versions are available for R&D applications. The instrument can accurately measure a wide variety of materials and is ideally suited for R&D investigation, quality inspection, failure analysis, and in-line production measurements.
ドキュメント

ドキュメントなし