説明
Tool will be configured for manual mask loading 5” 6” or 7” Optics magnifications M0 to M4 available Scanner Module Includes Stage Optics Light Source Lamp housing Camera Focus Laser Interferometer Mask handling assemblies IP Module: Detector Boards Database Express Data Express module: Pre Station構成
構成なしOEMモデルの説明
ARIS-i™ is an advanced reticle inspection system that uses Ultraviolet (UV) wavelengths to automatically inspect reticles used in device generations of 180 nm and below. It features dual image processing channels, a high-quality CCD camera, and a high-speed computing architecture to provide the highest throughput for handling advanced RET technologies such as PSM and OPC with sensitivity down to 150 nm. The system also includes a Data Express™ module for fast data conversion and rendering for die-to-database inspection, as well as a Line Width Error Detector (LWED) for detecting local and regional linewidth variations. With fast inspection setup, high reliability, and availability, ARIS-i™ is the tool of choice for mask makers and semiconductor manufacturers looking for the lowest cost of ownership.ドキュメント
ドキュメントなし
カテゴリ
Reticle / Mask Inspection
最終検証： 16日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
140567
ウェーハサイズ：
不明
ヴィンテージ：
2000
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
APPLIED MATERIALS (AMAT)
ARIS-i
カテゴリ
Reticle / Mask Inspection
最終検証： 16日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
140567
ウェーハサイズ：
不明
ヴィンテージ：
2000
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Tool will be configured for manual mask loading 5” 6” or 7” Optics magnifications M0 to M4 available Scanner Module Includes Stage Optics Light Source Lamp housing Camera Focus Laser Interferometer Mask handling assemblies IP Module: Detector Boards Database Express Data Express module: Pre Station構成
構成なしOEMモデルの説明
ARIS-i™ is an advanced reticle inspection system that uses Ultraviolet (UV) wavelengths to automatically inspect reticles used in device generations of 180 nm and below. It features dual image processing channels, a high-quality CCD camera, and a high-speed computing architecture to provide the highest throughput for handling advanced RET technologies such as PSM and OPC with sensitivity down to 150 nm. The system also includes a Data Express™ module for fast data conversion and rendering for die-to-database inspection, as well as a Line Width Error Detector (LWED) for detecting local and regional linewidth variations. With fast inspection setup, high reliability, and availability, ARIS-i™ is the tool of choice for mask makers and semiconductor manufacturers looking for the lowest cost of ownership.ドキュメント
ドキュメントなし