説明
Mask Inspection Microscope構成
Mask Inspection Microscope, Technical Instrument K2 CD2 Stages NikonOEMモデルの説明
The KMS-400 Critical Dimension Measurement and Inspection System is a completely automated pattern recognition and measurement system. The combination of high-resolution capabilities, a confocal microscope with a shallow depth of focus, and pattern recognition routines allow for easy capture of optical images for measurement.ドキュメント
ドキュメントなし
ZYGO
KMS400
カテゴリ
Reticle / Mask Inspection
最終検証： 6日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
65049
ウェーハサイズ：
不明
ヴィンテージ：
1997
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Mask Inspection Microscope構成
Mask Inspection Microscope, Technical Instrument K2 CD2 Stages NikonOEMモデルの説明
The KMS-400 Critical Dimension Measurement and Inspection System is a completely automated pattern recognition and measurement system. The combination of high-resolution capabilities, a confocal microscope with a shallow depth of focus, and pattern recognition routines allow for easy capture of optical images for measurement.ドキュメント
ドキュメントなし