説明
Process - Sample Analysis / Measurement Main System - Main tool (1) *Excluded Items: No chiller available構成
構成なしOEMモデルの説明
FEI’s Strata 400 STEM is a high-resolution analytical tool designed to support the increasing need for high-resolution analytical capabilities as device geometries shrink below 100 nm and new material systems are introduced. It includes integrated sample lift-out and handling, with SEM-STEM imaging to enable high-contrast, high-resolution analysis. The innovative Flipstage™ moves the sample from milling to STEM-imaging position in seconds, without breaking vacuum, while the new Sidewinder™ ion column provides improved sample throughput and ultimate sample quality.ドキュメント
ドキュメントなし
カテゴリ
SEM / FIB
最終検証： 今日
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
146759
ウェーハサイズ：
不明
ヴィンテージ：
2005
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
STRATA 400
カテゴリ
SEM / FIB
最終検証： 今日
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
146759
ウェーハサイズ：
不明
ヴィンテージ：
2005
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Process - Sample Analysis / Measurement Main System - Main tool (1) *Excluded Items: No chiller available構成
構成なしOEMモデルの説明
FEI’s Strata 400 STEM is a high-resolution analytical tool designed to support the increasing need for high-resolution analytical capabilities as device geometries shrink below 100 nm and new material systems are introduced. It includes integrated sample lift-out and handling, with SEM-STEM imaging to enable high-contrast, high-resolution analysis. The innovative Flipstage™ moves the sample from milling to STEM-imaging position in seconds, without breaking vacuum, while the new Sidewinder™ ion column provides improved sample throughput and ultimate sample quality.ドキュメント
ドキュメントなし