説明
説明なし構成
構成なしOEMモデルの説明
The Helios NanoLab™ 460F1 includes the EasyLift Nanomanipulator, which supports improved transmission electron microscopy (TEM) sample extraction yields through an intuitive, integrated UI. It also uses the MultiChem gas delivery system to optimize beam-assisted deposition or etching. Both systems are designed and built based on years of application knowledge and expertise in in situ sample extraction and gas-assisted FIB/SEM. In addition to simplifying the process of advanced failure analysis and TEM sample preparation, EasyLift and MultiChem improve operator confidence and consistency, thereby reducing the cost of ownership associated with the use of consumables. With the Helios 460F1 system, Discovery Labs can produce high-contrast, high-resolution STEM images, reducing "time to useful data" and reducing the need for a standalone S/TEM system. Every hour or day spent waiting for a laboratory to generate new process or material qualification data can cause delays in bringing a new product to market. With the ability to quickly generate high-quality, actionable 30 kV STEM images within the DualBeam, there are clear advantages for your laboratory.ドキュメント
ドキュメントなし
カテゴリ
SEM / FIB
最終検証： 12日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
153436
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
HELIOS NANOLAB 460F1
カテゴリ
SEM / FIB
最終検証： 12日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
153436
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
構成なしOEMモデルの説明
The Helios NanoLab™ 460F1 includes the EasyLift Nanomanipulator, which supports improved transmission electron microscopy (TEM) sample extraction yields through an intuitive, integrated UI. It also uses the MultiChem gas delivery system to optimize beam-assisted deposition or etching. Both systems are designed and built based on years of application knowledge and expertise in in situ sample extraction and gas-assisted FIB/SEM. In addition to simplifying the process of advanced failure analysis and TEM sample preparation, EasyLift and MultiChem improve operator confidence and consistency, thereby reducing the cost of ownership associated with the use of consumables. With the Helios 460F1 system, Discovery Labs can produce high-contrast, high-resolution STEM images, reducing "time to useful data" and reducing the need for a standalone S/TEM system. Every hour or day spent waiting for a laboratory to generate new process or material qualification data can cause delays in bringing a new product to market. With the ability to quickly generate high-quality, actionable 30 kV STEM images within the DualBeam, there are clear advantages for your laboratory.ドキュメント
ドキュメントなし