説明
Dual Beam FIB SEM The core instument includes: -Dedicated microscope controller with FEI Company xT software version 3.X.X -Support Computer with Windows 7 -2x 24" Widescreen LCD Monitors -Elstar Electron Column (refurbished Elstar FEG Tip) -21nA current Sidewinder Ion Column (New LMIS, Suppressor, & Extractor) -Ultra High Resolution 5 axis stage -In-lens Detector TLD - with SE and BSED modes (New TLD) -Secondary Electron Detector (SED) -Oil Free Pumping System構成
構成なしOEMモデルの説明
The Helios NanoLab 600 is a Dual Beam FIB/SEM (Focused Ion Beam/Scanning Electron Microscope) that is designed for high-end imaging during failure analysis. It features an extreme high-resolution column, a fine-probe ion source, and a 150 x 150 mm, five-axis, XY piezo stage. This makes it a smart investment for failure-analysis labs that require versatile sample handling, from packaged parts to eight-inch wafers. The Helios NanoLab 600 is particularly useful for cross-sectioning samples and delivers three-dimensional imaging, allowing you to quickly and efficiently locate and view device features from different angles. Additionally, patented beam chemistries can be used to highlight interface layers for imaging in the system, providing you with the most accurate data possible without additional preparation steps outside the system.ドキュメント
ドキュメントなし
カテゴリ
SEM / FIB
最終検証： 4日前
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
148411
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
HELIOS NANOLAB 600
カテゴリ
SEM / FIB
最終検証： 4日前
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
148411
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Dual Beam FIB SEM The core instument includes: -Dedicated microscope controller with FEI Company xT software version 3.X.X -Support Computer with Windows 7 -2x 24" Widescreen LCD Monitors -Elstar Electron Column (refurbished Elstar FEG Tip) -21nA current Sidewinder Ion Column (New LMIS, Suppressor, & Extractor) -Ultra High Resolution 5 axis stage -In-lens Detector TLD - with SE and BSED modes (New TLD) -Secondary Electron Detector (SED) -Oil Free Pumping System構成
構成なしOEMモデルの説明
The Helios NanoLab 600 is a Dual Beam FIB/SEM (Focused Ion Beam/Scanning Electron Microscope) that is designed for high-end imaging during failure analysis. It features an extreme high-resolution column, a fine-probe ion source, and a 150 x 150 mm, five-axis, XY piezo stage. This makes it a smart investment for failure-analysis labs that require versatile sample handling, from packaged parts to eight-inch wafers. The Helios NanoLab 600 is particularly useful for cross-sectioning samples and delivers three-dimensional imaging, allowing you to quickly and efficiently locate and view device features from different angles. Additionally, patented beam chemistries can be used to highlight interface layers for imaging in the system, providing you with the most accurate data possible without additional preparation steps outside the system.ドキュメント
ドキュメントなし