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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The FEI Nova NanoLab 200 is a powerful tool for researchers and developers working with complex structures below 100 nanometers. It combines ultra-high resolution field emission scanning electron microscopy (SEM) and precise focused ion beam (FIB) etch and deposition to provide advanced capabilities and flexibility. This tool complements existing nanotechnology laboratory tools and extends the range of applications for nanoscale prototyping, machining, 2D and 3D-characterization, and analysis.
    ドキュメント

    ドキュメントなし

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    verified-listing-icon

    検証済み

    カテゴリ
    SEM / FIB

    最終検証: 27日前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    117575


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    SEM / FIB
    ヴィンテージ: 0状態: 中古
    最終確認27日前

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    verified-listing-icon
    検証済み
    カテゴリ
    SEM / FIB
    最終検証: 27日前
    listing-photo-f33c93bbfeb5457b826a338b7cddd298-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    117575


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The FEI Nova NanoLab 200 is a powerful tool for researchers and developers working with complex structures below 100 nanometers. It combines ultra-high resolution field emission scanning electron microscopy (SEM) and precise focused ion beam (FIB) etch and deposition to provide advanced capabilities and flexibility. This tool complements existing nanotechnology laboratory tools and extends the range of applications for nanoscale prototyping, machining, 2D and 3D-characterization, and analysis.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    SEM / FIBヴィンテージ: 0状態: 中古最終検証:27日前
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    SEM / FIBヴィンテージ: 0状態: 中古最終検証:60日以上前