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説明
説明なし構成
Gallium FIB Gas injection sources: Platinum, Tungsten and SiO2 Omniprobe micromanipulator Cooling water chiller Instrument computer with all the necessary software for operating and supporting the instrument installed Comes with instruction manuals (USB memory) and assorted minor spare parts Good instrument for imaging, making sample cross sections and TEM lamellas The FIB-SEM is complete and fully functional, has been serviced and maintained by FEI technicians regularly every year since installationOEMモデルの説明
Nova 600 Nanolab DualBeam-SEM/FIB for Nanoscale Prototyping, Machining, Characterization, and Analysis of Structures below 100 nm.ドキュメント
ドキュメントなし
カテゴリ
SEM / FIB
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Idle
製品ID：
97598
ウェーハサイズ：
不明
ヴィンテージ：
2005
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
NOVA 600 NANOLAB
カテゴリ
SEM / FIB
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Idle
製品ID：
97598
ウェーハサイズ：
不明
ヴィンテージ：
2005
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
Gallium FIB Gas injection sources: Platinum, Tungsten and SiO2 Omniprobe micromanipulator Cooling water chiller Instrument computer with all the necessary software for operating and supporting the instrument installed Comes with instruction manuals (USB memory) and assorted minor spare parts Good instrument for imaging, making sample cross sections and TEM lamellas The FIB-SEM is complete and fully functional, has been serviced and maintained by FEI technicians regularly every year since installationOEMモデルの説明
Nova 600 Nanolab DualBeam-SEM/FIB for Nanoscale Prototyping, Machining, Characterization, and Analysis of Structures below 100 nm.ドキュメント
ドキュメントなし