説明
Dual Beam Microscope, 8in wafer, small sample holder (optional), choice of PT, C, or W chemistry. Deinstalled, can be setup and demonstrated with a PO.構成
Microscope Vacuum Stand SFEG Electron Column (</= 3nm resolution) Magnum/Pre Lens FIB Column ETD/TLD Detectors CDEM Detector 5 Axis computer controlled motorized stage Oil Free Turbo Vacuum System PT GIS Chemistry Electronics Rack All circuit boards IGP Power Supplies FEG, FIB, and Stage Power Supplies User Interface Cart Microscope PC Microscope Monitor, Keyboard, Mouse, and Joystick GIS Controller Software Sample HolderOEMモデルの説明
提供なしドキュメント
ドキュメントなし
カテゴリ
SEM / FIB
最終検証： 12日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
142420
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
XL 835
カテゴリ
SEM / FIB
最終検証： 12日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
142420
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Dual Beam Microscope, 8in wafer, small sample holder (optional), choice of PT, C, or W chemistry. Deinstalled, can be setup and demonstrated with a PO.構成
Microscope Vacuum Stand SFEG Electron Column (</= 3nm resolution) Magnum/Pre Lens FIB Column ETD/TLD Detectors CDEM Detector 5 Axis computer controlled motorized stage Oil Free Turbo Vacuum System PT GIS Chemistry Electronics Rack All circuit boards IGP Power Supplies FEG, FIB, and Stage Power Supplies User Interface Cart Microscope PC Microscope Monitor, Keyboard, Mouse, and Joystick GIS Controller Software Sample HolderOEMモデルの説明
提供なしドキュメント
ドキュメントなし