説明
Field Emission Scanning Electron Microscope (FE-SEM)構成
構成なしOEMモデルの説明
The FEI XL30 is a true ESEM with the ability to image specimens at pressures up to 20 mbar. It is also equipped with a cold stage capable of reaching temperatures down to -100 C. When running in high vacuum mode, it’s a very capable general purpose SEM utilizing a tungsten electron source. The extremely friendly user interface makes it ideal for novice users who do not require the higher resolution capabilities of an FESEM. Additional capabilities include EDS analysis and a nano-CT X-ray imaging system.ドキュメント
ドキュメントなし
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
XL30
検証済み
カテゴリ
SEM / FIB
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
97744
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
XL30
カテゴリ
SEM / FIB
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
97744
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Field Emission Scanning Electron Microscope (FE-SEM)構成
構成なしOEMモデルの説明
The FEI XL30 is a true ESEM with the ability to image specimens at pressures up to 20 mbar. It is also equipped with a cold stage capable of reaching temperatures down to -100 C. When running in high vacuum mode, it’s a very capable general purpose SEM utilizing a tungsten electron source. The extremely friendly user interface makes it ideal for novice users who do not require the higher resolution capabilities of an FESEM. Additional capabilities include EDS analysis and a nano-CT X-ray imaging system.ドキュメント
ドキュメントなし