説明
The ThermoFisher Apreo HiVac SEM is a Schottky Field Emission Scanning Electron Microscope (FESEM) that combines high and low-voltage ultra-high resolution capabilities with an electrostatic lens design. The instrument features beam deceleration and unique in-lens detection offering unprecedented contrast and versatility to researchers working with a variety of materials and devices. Achievable resolution is 0.8nm at 15kV and 1.0nm at 1kV using the immersion lens.構成
- Large capacity 5-axis stage with Nav-Cam visual navigation, greatly increasing ease of use and sample throughput - Beam current range: 0.78pA - 100nA - Accelerating voltage up to 30kV, with landing energy as low as 20eV - Everhart-Thornley detector (with secondary and backscatter modes) - In-column detectors - Sub-nanometer imaging resolution at high kV; ~ 1nm resolution at 1kV - Directional backscatter (DBS) detectorOEMモデルの説明
提供なしドキュメント
ドキュメントなし
カテゴリ
SEM / FIB
最終検証： 4日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
147933
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
APREO
カテゴリ
SEM / FIB
最終検証： 4日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
147933
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
The ThermoFisher Apreo HiVac SEM is a Schottky Field Emission Scanning Electron Microscope (FESEM) that combines high and low-voltage ultra-high resolution capabilities with an electrostatic lens design. The instrument features beam deceleration and unique in-lens detection offering unprecedented contrast and versatility to researchers working with a variety of materials and devices. Achievable resolution is 0.8nm at 15kV and 1.0nm at 1kV using the immersion lens.構成
- Large capacity 5-axis stage with Nav-Cam visual navigation, greatly increasing ease of use and sample throughput - Beam current range: 0.78pA - 100nA - Accelerating voltage up to 30kV, with landing energy as low as 20eV - Everhart-Thornley detector (with secondary and backscatter modes) - In-column detectors - Sub-nanometer imaging resolution at high kV; ~ 1nm resolution at 1kV - Directional backscatter (DBS) detectorOEMモデルの説明
提供なしドキュメント
ドキュメントなし