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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50
    説明
    説明なし
    構成
    Scanning Electron Microscope (SEM FEI XL50 Large sample chamber w/ load lock Capable to navigate full 8” wafer. Stage platen to hold full wafer Stage platen for multi stub analysis System is installed and operational Noran EDS detector
    OEMモデルの説明
    Scanning Electron Microscope
    ドキュメント

    ドキュメントなし

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    verified-listing-icon

    検証済み

    カテゴリ
    SEM / FIB

    最終検証： 60日以上前

    主なアイテムの詳細
    状態：

    Used

    稼働ステータス:

    Installed / Running

    製品ID：

    106592

    ウェーハサイズ：

    8"/200mm

    ヴィンテージ：

    不明

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    SEM / FIB
    ヴィンテージ： 0状態： 中古
    最終確認60日以上前

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    verified-listing-icon
    検証済み
    カテゴリ
    SEM / FIB
    最終検証： 60日以上前
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/38dae80b71814bf38a53fc90587c4001_236677b67b9a49f496b86efa74f8c8a61201a_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/182dd0818a3c4f1ebcd2984df58fadad_4039d73b2f624fc38421d284403382061201a_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/f19cd4d7032b42afa4f4ca49ca31ac5e_e6751da9a7a440adba2a12ad59206d69_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/50d72f683ea34c459c3d7ca97e79b32b_984fc513ced24c68b8b4b97e2c0ca1dc_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/ff5806e127714b8a96b87b5df596e3b1_59947b8bf1cf4383a1e7bb42846a4d65_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/7a4ea99a073e479fa132a4e522459d03_c8c06cebf72d4a519cb388abe2986a9b_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/e0b80c59da634d99822f2da87afdcc1f_457737e8432b4a829c675216985da2c4_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/8b82e9f60e984966b66013297f2ea9b2_c32f68d622e34971aa078c1f85f9f2521201a_mw.jpeg
    主なアイテムの詳細
    状態：

    Used

    稼働ステータス:

    Installed / Running

    製品ID：

    106592

    ウェーハサイズ：

    8"/200mm

    ヴィンテージ：

    不明

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    Scanning Electron Microscope (SEM FEI XL50 Large sample chamber w/ load lock Capable to navigate full 8” wafer. Stage platen to hold full wafer Stage platen for multi stub analysis System is installed and operational Noran EDS detector
    OEMモデルの説明
    Scanning Electron Microscope
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    SEM / FIBヴィンテージ： 0状態： 中古最終検証：60日以上前