説明
SEM構成
SEM, Large Sample Chamber (maximum 300mm diameter), 5-axis MD, Camera Navigation, Secondary/Reflection Electrons, Low Vacuum Secondary Electron Detector ESED-II, EDX HORIBA EMAX Evolution X Max50 EX470OEMモデルの説明
S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.ドキュメント
ドキュメントなし
HITACHI
S-3700N
検証済み
カテゴリ
SEM / FIB
最終検証： 20日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
116067
ウェーハサイズ：
不明
ヴィンテージ：
2017
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
S-3700N
カテゴリ
SEM / FIB
最終検証： 20日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
116067
ウェーハサイズ：
不明
ヴィンテージ：
2017
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
SEM構成
SEM, Large Sample Chamber (maximum 300mm diameter), 5-axis MD, Camera Navigation, Secondary/Reflection Electrons, Low Vacuum Secondary Electron Detector ESED-II, EDX HORIBA EMAX Evolution X Max50 EX470OEMモデルの説明
S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.ドキュメント
ドキュメントなし