説明
The S-4700 Type a high-resolution electron microscope. This unit has been meticulously maintained by Hitachi Trained Engineers and has benefited from continuous coverage under a service contract since its original manufacture and installation in the United States.構成
Water Chiller Rotary Pumps x2 Air Compressor HP Computer Keyboard / Mouse Toolbox and tools Secondary electron image resolution: 2.1 nm at 1 kV 1.5 nm at 15 kV Electron optics: Electron gun Cold field emission electron source Acc. voltage 0.5 ~ 30 kV (variable at 0.1 kV/step) Probe current 1 pA ~ 2 nA (depends on Acc. voltage) Magnification ×20 ×500,000 Objective aperture Heated movable aperture, 4-opening, selectable and alignable outside the vacuum Image display: Operation/display OS: Windows 2000 Scan mode: Normal, Split/dual mag./line scan, position set, spot, AAF, SAA, oblique Frame memory: 640 × 480 pixels, 1,280 × 960 pixels, 2,560 × 1,920 pixels Image filing Image data base with various reference functions built-in Image file format BMP, TIFF, JPEG selectable Scan speed TV, slow (0.5 ~ 40 s/frame) for viewing Slow (40 ~ 320 s/frame) for recording Image processing Automatic image brightness & contrast, raster rotation, autofocus, auto-stigmation, averaging, frame integration, color display Auto data recording Film numbering, acc. voltage, micron bar with a scale, magnification, date, hours and working distance Electrical image shift ±15 microns (at W.D = 12 mm) Vacuum system System Automatic vacuum sequence with pneumatic valve controls Evacuation: Vacuum ~10–7 Pa (electron gun), ~10–4 Pa (specimen chamber) Pumps Fore pumps 140 l/min (168 l/min) Diffusion pump 570 l/s × 1 set, and Ion pumps × 3 sets Protection System protection against power, water and vacuum failures. Dimensions & weight: Column 82 × 88 × 165 (H) cm, 410 kg (for type II stage) Display 120 × 90 × 137(H) cm, 235 kg Ion pump power supply 37 × 60 × 60 (H) cm, 75 kg Power unit 39 × 70 × 47 (H) cm, 35 kgOEMモデルの説明
The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.ドキュメント
ドキュメントなし
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Running
製品ID：
144526
ウェーハサイズ：
不明
HDD / Software:
Yes
Resolution:
1.5 nm
Electron:
Cold Field Emission
Loadlock:
Type 1 4 Inch
Detectors:
SE detector, Upper and Lower
ヴィンテージ：
2001
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
HITACHI
S-4700 I
カテゴリ
SEM / FIB
最終検証： 15日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Running
製品ID：
144526
ウェーハサイズ：
不明
HDD / Software:
Yes
Resolution:
1.5 nm
Electron:
Cold Field Emission
Loadlock:
Type 1 4 Inch
Detectors:
SE detector, Upper and Lower
ヴィンテージ：
2001
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
The S-4700 Type a high-resolution electron microscope. This unit has been meticulously maintained by Hitachi Trained Engineers and has benefited from continuous coverage under a service contract since its original manufacture and installation in the United States.構成
Water Chiller Rotary Pumps x2 Air Compressor HP Computer Keyboard / Mouse Toolbox and tools Secondary electron image resolution: 2.1 nm at 1 kV 1.5 nm at 15 kV Electron optics: Electron gun Cold field emission electron source Acc. voltage 0.5 ~ 30 kV (variable at 0.1 kV/step) Probe current 1 pA ~ 2 nA (depends on Acc. voltage) Magnification ×20 ×500,000 Objective aperture Heated movable aperture, 4-opening, selectable and alignable outside the vacuum Image display: Operation/display OS: Windows 2000 Scan mode: Normal, Split/dual mag./line scan, position set, spot, AAF, SAA, oblique Frame memory: 640 × 480 pixels, 1,280 × 960 pixels, 2,560 × 1,920 pixels Image filing Image data base with various reference functions built-in Image file format BMP, TIFF, JPEG selectable Scan speed TV, slow (0.5 ~ 40 s/frame) for viewing Slow (40 ~ 320 s/frame) for recording Image processing Automatic image brightness & contrast, raster rotation, autofocus, auto-stigmation, averaging, frame integration, color display Auto data recording Film numbering, acc. voltage, micron bar with a scale, magnification, date, hours and working distance Electrical image shift ±15 microns (at W.D = 12 mm) Vacuum system System Automatic vacuum sequence with pneumatic valve controls Evacuation: Vacuum ~10–7 Pa (electron gun), ~10–4 Pa (specimen chamber) Pumps Fore pumps 140 l/min (168 l/min) Diffusion pump 570 l/s × 1 set, and Ion pumps × 3 sets Protection System protection against power, water and vacuum failures. Dimensions & weight: Column 82 × 88 × 165 (H) cm, 410 kg (for type II stage) Display 120 × 90 × 137(H) cm, 235 kg Ion pump power supply 37 × 60 × 60 (H) cm, 75 kg Power unit 39 × 70 × 47 (H) cm, 35 kgOEMモデルの説明
The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.ドキュメント
ドキュメントなし