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HITACHI S-4700 II
  • HITACHI S-4700 II
  • HITACHI S-4700 II
説明
ANALYTICAL EQUIPMENT
構成
-Type II stage with 5 axis motorization -Type I load lock, 4 inch (optional 6 inch) -Full control pad -CD Measurement -Turbo Pump -Upgrade to Windows XP Pro
OEMモデルの説明
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.
ドキュメント

ドキュメントなし

verified-listing-icon

検証済み

カテゴリ
SEM / FIB

最終検証: 60日以上前

主なアイテムの詳細

状態:

Refurbished


稼働ステータス:

不明


製品ID:

17698


ウェーハサイズ:

不明


ヴィンテージ:

不明


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

HITACHI

S-4700 II

verified-listing-icon
検証済み
カテゴリ
SEM / FIB
最終検証: 60日以上前
listing-photo-IVA6y91oQLTuXGg3VXKQJl88w1S_f5ty1Pb7faipOGE-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/4XNDG-xLtCutTaATjlww479MR6nFgLrvs2zjoiuCPeY/IVA6y91oQLTuXGg3VXKQJl88w1S_f5ty1Pb7faipOGE/y24nn3gWodfssmwVwOJUR4nAw_9Pe5fq6dszqf4Sljs_20181117_122053_f
listing-photo-IVA6y91oQLTuXGg3VXKQJl88w1S_f5ty1Pb7faipOGE-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/4XNDG-xLtCutTaATjlww479MR6nFgLrvs2zjoiuCPeY/IVA6y91oQLTuXGg3VXKQJl88w1S_f5ty1Pb7faipOGE/MsQIkxy3kox6AnlGdAupCBlajkQDi5XtOlAV58gHmJE_20181117_122053_f
主なアイテムの詳細

状態:

Refurbished


稼働ステータス:

不明


製品ID:

17698


ウェーハサイズ:

不明


ヴィンテージ:

不明


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
ANALYTICAL EQUIPMENT
構成
-Type II stage with 5 axis motorization -Type I load lock, 4 inch (optional 6 inch) -Full control pad -CD Measurement -Turbo Pump -Upgrade to Windows XP Pro
OEMモデルの説明
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.
ドキュメント

ドキュメントなし