説明
Experience the precision and power of the Hitachi S-4800-1 Scanning Electron Microscope, a versatile tool essential for detailed material analysis. The upright microscope structure allows for comfortable operation and a broad field of view, ideal for both laboratory and industrial applications. Equipped with advanced features, the S4800-1 model offers exceptional image quality and resolution, making it a go-to instrument for researchers and technicians in various fields. Whether you’re examining surfaces or conducting material studies, this SEM is engineered to deliver reliable and accurate results.構成
構成なしOEMモデルの説明
The S-4800 is an advanced Field Emission Scanning Electron Microscope (FE-SEM) that builds upon the proven performance of its predecessors, the S-4700 and S-5200. With beam deceleration technology, it achieves an impressive resolution of 1.4 nm at 1 kV and 1.0 nm at 15 kV. The microscope features a semi-in-lens detector design, allowing for the examination of large samples without compromising ultra-high resolution at low accelerating voltages. The innovative objective lens design incorporates Hitachi's Super ExB filter technology, which effectively separates pure secondary electrons (SE), compositional SE, and backscattered electron (BSE) signals. With a specimen diameter of 200 mm and a 5-axis motorized eucentric stage, it offers exceptional sample accommodation and positioning capabilities. The S-4800 is compatible with optional accessories such as Energy Dispersive X-ray Spectrometer (EDX) and Electron Backscatterted Diffraction Pattern (EBDP) systems, making it suitable for a range of ultra-high resolution applications in fields like semiconductor research, materials studies, and nanotechnology.ドキュメント
ドキュメントなし
同様のリスト
すべて表示
HITACHI
S-4800
カテゴリ
SEM / FIB
最終検証： 7日前
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
142450
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Experience the precision and power of the Hitachi S-4800-1 Scanning Electron Microscope, a versatile tool essential for detailed material analysis. The upright microscope structure allows for comfortable operation and a broad field of view, ideal for both laboratory and industrial applications. Equipped with advanced features, the S4800-1 model offers exceptional image quality and resolution, making it a go-to instrument for researchers and technicians in various fields. Whether you’re examining surfaces or conducting material studies, this SEM is engineered to deliver reliable and accurate results.構成
構成なしOEMモデルの説明
The S-4800 is an advanced Field Emission Scanning Electron Microscope (FE-SEM) that builds upon the proven performance of its predecessors, the S-4700 and S-5200. With beam deceleration technology, it achieves an impressive resolution of 1.4 nm at 1 kV and 1.0 nm at 15 kV. The microscope features a semi-in-lens detector design, allowing for the examination of large samples without compromising ultra-high resolution at low accelerating voltages. The innovative objective lens design incorporates Hitachi's Super ExB filter technology, which effectively separates pure secondary electrons (SE), compositional SE, and backscattered electron (BSE) signals. With a specimen diameter of 200 mm and a 5-axis motorized eucentric stage, it offers exceptional sample accommodation and positioning capabilities. The S-4800 is compatible with optional accessories such as Energy Dispersive X-ray Spectrometer (EDX) and Electron Backscatterted Diffraction Pattern (EBDP) systems, making it suitable for a range of ultra-high resolution applications in fields like semiconductor research, materials studies, and nanotechnology.ドキュメント
ドキュメントなし