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説明
ANALYTICAL EQUIPMENT構成
Operating System: Windows XP Pro Optional Specimen Holders: Cross Section holder Quartz PCI Water Recirculator: SMC Secondary Electron image resolution: 0.4nm at 30kV and 1.6nm at 1kV Specimen Stage Stage Traverse: X: +3.5mm, Y: +2.0mm, Z:+0.3mm, T: +40 degrees Sample size: • Bulk - 5.0mm x 9.5mm x 3.5mmH (max) • Cross-Section: 2.0mm x 6.0mm x 5.0mmH (max)OEMモデルの説明
The S-5500, Immersion Lens system which generates the highest resolution images in the world(*1)(0.4nm at 30kV. The S-5500 have improved performance over that of its predecessor, the S-5200. [Main features of S-5500] (1) The world’s highest resolution, 0.4 nm at 30 kV, achieved by the use of a new electron optics system (as of October 2004). (2) New BF (bright field)/ DF (dark field) Duo STEM (scanning transmission electron microscopy) detector allows simultaneous display of BF and DF STEM images. In DF STEM mode, this detector is capable of providing images with variable detection angles. This new detection system greatly extends the usage of low accelerating voltage STEM at 30 kV.ドキュメント
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HITACHI
S-5500
カテゴリ
SEM / FIB
最終検証： 60日以上前
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
43497
ウェーハサイズ：
不明
ヴィンテージ：
不明
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説明
ANALYTICAL EQUIPMENT構成
Operating System: Windows XP Pro Optional Specimen Holders: Cross Section holder Quartz PCI Water Recirculator: SMC Secondary Electron image resolution: 0.4nm at 30kV and 1.6nm at 1kV Specimen Stage Stage Traverse: X: +3.5mm, Y: +2.0mm, Z:+0.3mm, T: +40 degrees Sample size: • Bulk - 5.0mm x 9.5mm x 3.5mmH (max) • Cross-Section: 2.0mm x 6.0mm x 5.0mmH (max)OEMモデルの説明
The S-5500, Immersion Lens system which generates the highest resolution images in the world(*1)(0.4nm at 30kV. The S-5500 have improved performance over that of its predecessor, the S-5200. [Main features of S-5500] (1) The world’s highest resolution, 0.4 nm at 30 kV, achieved by the use of a new electron optics system (as of October 2004). (2) New BF (bright field)/ DF (dark field) Duo STEM (scanning transmission electron microscopy) detector allows simultaneous display of BF and DF STEM images. In DF STEM mode, this detector is capable of providing images with variable detection angles. This new detection system greatly extends the usage of low accelerating voltage STEM at 30 kV.ドキュメント
ドキュメントなし