説明
説明なし構成
構成なしOEMモデルの説明
FE-SEM The new SU8000 features a top detector along with a semi-in-lens type of objective lens. This technology is a further advance on the popular upper backscattered electron detector used in the S-5500. By combining the top detector with the conventional upper detector technology, Hitachi has now developed a new signal detection system for optimum contrast visualization of signals, generated from the sample. These signals include secondary electrons, low-angle backscattered electrons and high-angle backscattered electrons, which are acquired for observation of surface structures.ドキュメント
HITACHI
SU8000
カテゴリ
SEM / FIB
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
126951
ウェーハサイズ：
不明
ヴィンテージ：
2010
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available