説明
Under Service Contract Gun tip will be replaced prior to sale.構成
Aberration-corrected scanning transmission electron microscope (STEM) EDS detector - SDD based and does not need LN ADF detector Bright field detector Secondary electron detector (enabling atomic-resolution SEM imaging) In-situ heating/biasing MEMS-based holder Double-tilt holder Plan-view sample holder Hitachi FIB-compatible holderOEMモデルの説明
The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user's effort in doing aberration correction. Large solid-angle EDS* and atomic-spatial-resolution EDS* and EELS spectrum imaging* are enabled.ドキュメント
ドキュメントなし
HITACHI
HD-2700
カテゴリ
SEM / FIB
最終検証： 3日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
133588
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Under Service Contract Gun tip will be replaced prior to sale.構成
Aberration-corrected scanning transmission electron microscope (STEM) EDS detector - SDD based and does not need LN ADF detector Bright field detector Secondary electron detector (enabling atomic-resolution SEM imaging) In-situ heating/biasing MEMS-based holder Double-tilt holder Plan-view sample holder Hitachi FIB-compatible holderOEMモデルの説明
The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user's effort in doing aberration correction. Large solid-angle EDS* and atomic-spatial-resolution EDS* and EELS spectrum imaging* are enabled.ドキュメント
ドキュメントなし