メインコンテンツにスキップ
Moov logo

Moov Icon
HITACHI NB5000
    説明
    Dual beam Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
    構成
    Resolution: SEM: 1.0 nm at 15 kV FIB: 5 nm at 40 kV FIB Column: Ga Ion source: >50 nA 2-Stage electro static lens system Octopole electro static lens system Pattern generator system: 4K x 4K SEM Column: Maximum beam current: >30 nA 3-Stage electro magnetic lens reduction system Electro static blanking system SE Power supply Image memory: 2560 x 1920 Vacuum system: Turbo molecular pump Dry pump Ion source chamber Electron gun (2) Buffer tanks Micro-sampling system: 3-Axis motor drive system X Range: 1 mm Y Range: 2 mm Z Range: 2.5 mm Chamber scope: LCD Monitor, 7" Stand IR Camera Power cable AC / DC Adaptor Air compressor N2 Gas leak system Multi-stage control panel Console control unit Power supply unit AC Power distribution Transformer Laser sample height adjust tool Manual sample height adjust tool Interlock function PC Processor: INTEL i7 Flat panel LCD Monitor, 22" Mouse Keyboard Control panel RAM: 16 GB Hard Disk Drive (HDD): 500 GB Does not include EDS Operating system: Windows 7, 64-Bit
    OEMモデルの説明
    提供なし
    ドキュメント

    ドキュメントなし

    verified-listing-icon

    検証済み

    カテゴリ
    SEM / FIB

    最終検証: 15日前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    138358


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2018


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    HITACHI NB5000

    HITACHI

    NB5000

    SEM / FIB
    ヴィンテージ: 2018状態: 中古
    最終確認今日

    HITACHI

    NB5000

    verified-listing-icon
    検証済み
    カテゴリ
    SEM / FIB
    最終検証: 15日前
    listing-photo-ea2c6480c17c40ee89e6c837a92baee5-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    138358


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2018


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Dual beam Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
    構成
    Resolution: SEM: 1.0 nm at 15 kV FIB: 5 nm at 40 kV FIB Column: Ga Ion source: >50 nA 2-Stage electro static lens system Octopole electro static lens system Pattern generator system: 4K x 4K SEM Column: Maximum beam current: >30 nA 3-Stage electro magnetic lens reduction system Electro static blanking system SE Power supply Image memory: 2560 x 1920 Vacuum system: Turbo molecular pump Dry pump Ion source chamber Electron gun (2) Buffer tanks Micro-sampling system: 3-Axis motor drive system X Range: 1 mm Y Range: 2 mm Z Range: 2.5 mm Chamber scope: LCD Monitor, 7" Stand IR Camera Power cable AC / DC Adaptor Air compressor N2 Gas leak system Multi-stage control panel Console control unit Power supply unit AC Power distribution Transformer Laser sample height adjust tool Manual sample height adjust tool Interlock function PC Processor: INTEL i7 Flat panel LCD Monitor, 22" Mouse Keyboard Control panel RAM: 16 GB Hard Disk Drive (HDD): 500 GB Does not include EDS Operating system: Windows 7, 64-Bit
    OEMモデルの説明
    提供なし
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    HITACHI NB5000

    HITACHI

    NB5000

    SEM / FIBヴィンテージ: 2018状態: 中古最終検証:今日
    HITACHI NB5000

    HITACHI

    NB5000

    SEM / FIBヴィンテージ: 2011状態: 中古最終検証:60日以上前
    HITACHI NB5000

    HITACHI

    NB5000

    SEM / FIBヴィンテージ: 2018状態: 中古最終検証:15日前