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説明
説明なし構成
構成なしOEMモデルの説明
The JEM-2010F Field Emission Electron Microscope is a versatile, high-resolution analytical tool designed for superior image quality and top-tier analytical performance. Developed for the 200kV class analytical TEM, it offers a broad range of capabilities including high-resolution image observation and microarea X-ray analysis. The JEM-2010F can be optionally equipped with energy dispersive X-ray spectrometers (EDS), a parallel detection electron energy spectrometer (PEELS), a scanning image observation device (ASID), and TV units, enhancing its functionality and adaptability to various research needs.ドキュメント
ドキュメントなし
JEOL
JEM-2010F
カテゴリ
SEM / FIB
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
70438
ウェーハサイズ：
不明
ヴィンテージ：
不明
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説明
説明なし構成
構成なしOEMモデルの説明
The JEM-2010F Field Emission Electron Microscope is a versatile, high-resolution analytical tool designed for superior image quality and top-tier analytical performance. Developed for the 200kV class analytical TEM, it offers a broad range of capabilities including high-resolution image observation and microarea X-ray analysis. The JEM-2010F can be optionally equipped with energy dispersive X-ray spectrometers (EDS), a parallel detection electron energy spectrometer (PEELS), a scanning image observation device (ASID), and TV units, enhancing its functionality and adaptability to various research needs.ドキュメント
ドキュメントなし