説明
Good working condition構成
Resolution: High-Vaccum mode (HV mode) 3.0nm Acc V 30 kV, WD 8mm, SEI 8.0nm Acc V 3 kV, WD 6mm, SEI 15.0nm Acc V 1 kV, WD 6mm, SEI Low-vaccum mode (LV) 4.0nm Acc V 30kV, WD 5mm, BEI Image mode: HV Mode SEI (E.T detector) BEI (E.T detector) BEI (Composition image, Topographic and stereoscopic images by BEI semiconductor detector) LV Mode: BEI (Composition image, Topographic and stereoscopic images by semiconductor detector) Magnification: x5 to 300,000 (149 steps) (x5 to x8: WD46mm or longer and Acc. V 10kV or less Probe current: 1pA to 1 uA Vacuum pressure in the specimen chamber Adjustable pressure 10 to 270Pa Electron optical system (EOS) Except the automatic gun control, applicable to both LV and HV modes Electron gun Accelerating voltage 30kV (Max) Filament Precentered tungsten hairpin filament Bias voltage Seamless automatic bias (linked to Acc. V) Automatic gun control Filament-heating current setting and alignment (possible only at HV mode) Beam blanking Preventing the specimen damage from the irradiation of the electron beam Lens system Condenser lens (CL) Electromagnetic 2-stage zoom condenser lens system Objective lens (OL) Conical mini-lens Focusing Automatic or manual focusing possible Automatic focus tracer Linked to WD Wobbler Provided for objective-lens aperture alignment, Linked to magnification Objective-lens aperture Optionally selectable from the following two types: MAP3: 3-step selectable with click-stops, fine X-Y adjustment possible MAP1: Single aperture, fine X-Y adjustment possible Stage Type Eucentric stage Specimen movement 5 axes X – 80mm Y – 40mm Z – eucentric movement range for WD of 5 to 48 mm Focusing range for WD of 5 to 48mm Tilt - -10 to +90 degree Rotation – 360 degree endless Specimen holders For 32mm diameter x 10mm thick Possible to mount a 150mm diameter specimen Detector HV Mode: SE detector – ETD (consisting of collector, scintillator, light guide and photomultiplier tube) LV Mode BSE detector Semiconductor (P-N junction) detector (can also be used in the HV Mode) PC type HPXW4600 Workstation Main Memory – 2 GB RAM CPU- Intel ® Core ™ 2 DuoCPU Connection type- Stand alone Operational table: 900 mm (W) x 900 mm (D) x 750 mm (H)OEMモデルの説明
Introducing the JSM-6510LV Low Vacuum SEM: a high-performance, cost-effective scanning electron microscope. Ideal for fast characterization and imaging of fine structures, it belongs to a widely-used SEM family applicable in diverse research and industrial fields. Its selectable Low Vacuum mode enables observation of specimens with excessive water content or non-conductive surfaces. With a remarkable resolution of 3.0nm at 30kV, it offers exceptional clarity for precise measurements and 3D analysis. The SEM features dual live image display to contrast and compare specific details. Enhance your research further with optional elemental analysis using the energy dispersive X-ray spectrometer (EDS). Discover unparalleled imaging resolution, versatility, and ease of use with JSM-6510LV.ドキュメント
JEOL
JSM-6510LV
検証済み
カテゴリ
SEM / FIB
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
112131
ウェーハサイズ：
不明
ヴィンテージ：
2009
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JSM-6510LV
カテゴリ
SEM / FIB
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
112131
ウェーハサイズ：
不明
ヴィンテージ：
2009
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available