SMI3050SE
カテゴリ
SEM / FIB概要（Overview）
SMI3050SE is an FIB-SEM hybrid system equipped with an ion beam optical system and electron beam optical system newly developed in response to the shrink of semiconductor devices, enabling high-precision sample processing and observation in comparison to conventional systems.
現在の掲載品
1
サービス
検査、保証、鑑定、ロジスティクス
