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VEGA
カテゴリ
SEM / FIB概要（Overview）
TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software.
現在の掲載品
1
サービス
検査、保証、鑑定、ロジスティクス
