説明
Asset Description - Focus Ion Beam Mill Software Version - Windows CIM - NONE Process - Focus Ion Beam Mill Fab Section - Test Excluded Items List (Pumps, Chillers & Abatement are all excluded)構成
System Type Description Quantity Main System FIB tool designed for Packaging and Deep cuts 1 Factory Interface NONE Options System Others Handler System ManualOEMモデルの説明
The Orion NanoFab Helium Ion Microscope (HIM) operates using ionized Helium or Neon gases rather than electrons for imaging and milling of materials. Helium is typically used for imaging and milling very thin films (e.g. graphene), with a spot size ~0.5 nm. Neon is is heavier, and thus better adapted for milling bulk materials and thin films with a spot size of ~2 nm.ドキュメント
カテゴリ
SEM / FIB
最終検証： 15日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
136497
ウェーハサイズ：
8"/200mm
ヴィンテージ：
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZEISS / CARL ZEISS
ORION NanoFab
カテゴリ
SEM / FIB
最終検証： 15日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
136497
ウェーハサイズ：
8"/200mm
ヴィンテージ：
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available