説明
-Comments: System decommissioned in July 2024 from operational. New tip is required.構成
-Windows OS: W10 -Software Version: SmartSEM (v6) -Source Type: TFE -Variable Pressure: Yes -Primary Pump: Turbo -Detector 1: Everheart Thornley Secondary Electron Detector -Detector 2: Inlens detectorOEMモデルの説明
The SUPRA® 55VP is a high-resolution scanning electron microscope that features proprietary VP (variable pressure) technology for the GEMINI® column. This technology enables direct imaging of non-conductive or delicate specimens without the need for complicated sample preparation techniques. The VP technology is also available on the SUPRA® 40 VP and SUPRA® 60 VP. The operation of high vacuum mode or variable pressure mode can be easily selected with a simple mouse click. The SUPRA® 55VP offers the highest resolution available today, comparable with “in-lens instruments”, combined with a superb large fully eucentric 5” stage and a large multi-functional specimen chamber. It has been designed for the most demanding applications in nanotechnology, with sub-nm resolution readily attainable. This makes the SUPRA® 55VP a versatile and user-friendly tool for a wide range of applications.ドキュメント
ドキュメントなし
ZEISS / CARL ZEISS
SUPRA 55VP
検証済み
カテゴリ
SEM / FIB
最終検証： 12日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
116432
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZEISS / CARL ZEISS
SUPRA 55VP
カテゴリ
SEM / FIB
最終検証： 12日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
116432
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
-Comments: System decommissioned in July 2024 from operational. New tip is required.構成
-Windows OS: W10 -Software Version: SmartSEM (v6) -Source Type: TFE -Variable Pressure: Yes -Primary Pump: Turbo -Detector 1: Everheart Thornley Secondary Electron Detector -Detector 2: Inlens detectorOEMモデルの説明
The SUPRA® 55VP is a high-resolution scanning electron microscope that features proprietary VP (variable pressure) technology for the GEMINI® column. This technology enables direct imaging of non-conductive or delicate specimens without the need for complicated sample preparation techniques. The VP technology is also available on the SUPRA® 40 VP and SUPRA® 60 VP. The operation of high vacuum mode or variable pressure mode can be easily selected with a simple mouse click. The SUPRA® 55VP offers the highest resolution available today, comparable with “in-lens instruments”, combined with a superb large fully eucentric 5” stage and a large multi-functional specimen chamber. It has been designed for the most demanding applications in nanotechnology, with sub-nm resolution readily attainable. This makes the SUPRA® 55VP a versatile and user-friendly tool for a wide range of applications.ドキュメント
ドキュメントなし