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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 200
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The FEI FIB 200 is a type of Focused Ion Beam (FIB) system that has many uses, such as editing circuits, analyzing defects and failures, preparing TEM lamella, fabricating nanostructures, prototyping at the nanoscale, and working with MEMS. There are a few different models of the FEI FIB 200, including the FEI FIB 200-M and the FEI FIB 200-P. The FEI FIB 200-M model features a Magnum ion column that provides twice the milling power of earlier pre-lens FIB columns. It also has a voltage range of 5-30kV for its Magnum column, a beam current of 21nA for milling power, and CDEM for ion and electron imaging with a resolution of 7nm. The FEI FIB 200-P model, on the other hand, uses a pre-lens ion column.
    ドキュメント

    ドキュメントなし

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 200

    verified-listing-icon

    検証済み

    カテゴリ
    SEM

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    110035


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 200

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 200

    SEM
    ヴィンテージ: 0状態: 中古
    最終確認30日以上前

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 200

    verified-listing-icon
    検証済み
    カテゴリ
    SEM
    最終検証: 60日以上前
    listing-photo-d8a3774c25434db3af51ca808c695f59-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    110035


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The FEI FIB 200 is a type of Focused Ion Beam (FIB) system that has many uses, such as editing circuits, analyzing defects and failures, preparing TEM lamella, fabricating nanostructures, prototyping at the nanoscale, and working with MEMS. There are a few different models of the FEI FIB 200, including the FEI FIB 200-M and the FEI FIB 200-P. The FEI FIB 200-M model features a Magnum ion column that provides twice the milling power of earlier pre-lens FIB columns. It also has a voltage range of 5-30kV for its Magnum column, a beam current of 21nA for milling power, and CDEM for ion and electron imaging with a resolution of 7nm. The FEI FIB 200-P model, on the other hand, uses a pre-lens ion column.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 200

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 200

    SEMヴィンテージ: 0状態: 中古最終検証:30日以上前
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 200

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 200

    SEMヴィンテージ: 0状態: 中古最終検証:60日以上前