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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS QUANTA 3D FEG
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The FEI Quanta 3D FEG is a dual beam system that combines a field emission scanning electron column and an ion column with a Gallium ion source. It is equipped with multiple analytical and manipulative tools, allowing for the application of different techniques and methods within the same chamber. The system features three imaging modes: high vacuum, low vacuum, and ESEM, and is equipped with high-resolution imaging and surface analysis methodologies such as BSE, SE, ISE, and EDS. The ion and electron beam can be used in combination with a gas injection system to deposit thin layers of Pt to protect an exploration site. The instrument also has a Peltier cooling stage and an automated nanomanipulator from Omniprobe.
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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    QUANTA 3D FEG

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    検証済み

    カテゴリ
    SEM

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    49151


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明

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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    QUANTA 3D FEG

    verified-listing-icon
    検証済み
    カテゴリ
    SEM
    最終検証: 60日以上前
    listing-photo-e01b13477a9c43ed9cd77852891c991b-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    49151


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The FEI Quanta 3D FEG is a dual beam system that combines a field emission scanning electron column and an ion column with a Gallium ion source. It is equipped with multiple analytical and manipulative tools, allowing for the application of different techniques and methods within the same chamber. The system features three imaging modes: high vacuum, low vacuum, and ESEM, and is equipped with high-resolution imaging and surface analysis methodologies such as BSE, SE, ISE, and EDS. The ion and electron beam can be used in combination with a gas injection system to deposit thin layers of Pt to protect an exploration site. The instrument also has a Peltier cooling stage and an automated nanomanipulator from Omniprobe.
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    ドキュメントなし

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    すべて表示

    同様のリストが見つかりません