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HITACHI RS-4000
    説明
    MET
    構成
    構成なし
    OEMモデルの説明
    The RS-4000 performs at a high throughput of 1,200 DPH (defects per hour), which is about 3 times faster than the conventional model, and performs defect review at a high speed and high defect capture rate thereby improving image resolution (3 nm) and enhancing image processing. Combined with ADC (automatic defect classification) to identify killer defects, the tool produces data directly linked with yield enhancement in a short time. Furthermore, the newly added function of tilt image observation by tilting the electron beam enables the tool to generate more defect information.
    ドキュメント

    ドキュメントなし

    HITACHI

    RS-4000

    verified-listing-icon

    検証済み

    カテゴリ
    SEM

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    75675


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    2003


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    HITACHI RS-4000

    HITACHI

    RS-4000

    SEM
    ヴィンテージ: 2005状態: 中古
    最終確認60日以上前

    HITACHI

    RS-4000

    verified-listing-icon
    検証済み
    カテゴリ
    SEM
    最終検証: 60日以上前
    listing-photo-f4f3396ec9e74ec69c686d7806c94393-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    75675


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    2003


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    MET
    構成
    構成なし
    OEMモデルの説明
    The RS-4000 performs at a high throughput of 1,200 DPH (defects per hour), which is about 3 times faster than the conventional model, and performs defect review at a high speed and high defect capture rate thereby improving image resolution (3 nm) and enhancing image processing. Combined with ADC (automatic defect classification) to identify killer defects, the tool produces data directly linked with yield enhancement in a short time. Furthermore, the newly added function of tilt image observation by tilting the electron beam enables the tool to generate more defect information.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    HITACHI RS-4000

    HITACHI

    RS-4000

    SEMヴィンテージ: 2005状態: 中古最終検証:60日以上前
    HITACHI RS-4000

    HITACHI

    RS-4000

    SEMヴィンテージ: 2003状態: 中古最終検証:60日以上前
    HITACHI RS-4000

    HITACHI

    RS-4000

    SEMヴィンテージ: 2003状態: 中古最終検証:60日以上前