説明
FE Sem with Horriba EMAX EDX構成
FE Sem with Horriba EMAX EDX Windows 2000 based system TYPE 2 Stage - Motorized stage system 17 inch LCD monitor Pentium 4 control PC System detail : Main body - 1 Display unit - 1 Power rack - 1 IP power rack - 1 Rotary pump - 2 Weight and vacuum hose - 1 Option: Chamber cameraOEMモデルの説明
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.ドキュメント
ドキュメントなし
HITACHI
S-4700 II
検証済み
カテゴリ
SEM
最終検証： 23日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
76064
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
S-4700 II
カテゴリ
SEM
最終検証： 23日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
76064
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2001
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
FE Sem with Horriba EMAX EDX構成
FE Sem with Horriba EMAX EDX Windows 2000 based system TYPE 2 Stage - Motorized stage system 17 inch LCD monitor Pentium 4 control PC System detail : Main body - 1 Display unit - 1 Power rack - 1 IP power rack - 1 Rotary pump - 2 Weight and vacuum hose - 1 Option: Chamber cameraOEMモデルの説明
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.ドキュメント
ドキュメントなし