説明
説明なし構成
Hitachi S-4700-II is a Cold Field Emission Gun Scanning Electron Microscope (CFE-SEM), it combines the versatility of PC control with a novel electron optical column to give an exceptional performance on large and small specimens. The S-4700-II also offers excellent low kV performance with a guaranteed resolution of 2.1 nm at 1 kV at a working distance of 1.5mm. Available image mode includes a secondary electron image. There are two secondary electron detectors; one above the objective lens, the other below. The Oxford EDS system is included. This S-4700 II is fully refurbished and operational at our Tustin, CA facility.OEMモデルの説明
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.ドキュメント
ドキュメントなし
HITACHI
S-4700 II
検証済み
カテゴリ
SEM
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
23124
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
S-4700 II
検証済み
カテゴリ
SEM
最終検証： 60日以上前
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
23124
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
Hitachi S-4700-II is a Cold Field Emission Gun Scanning Electron Microscope (CFE-SEM), it combines the versatility of PC control with a novel electron optical column to give an exceptional performance on large and small specimens. The S-4700-II also offers excellent low kV performance with a guaranteed resolution of 2.1 nm at 1 kV at a working distance of 1.5mm. Available image mode includes a secondary electron image. There are two secondary electron detectors; one above the objective lens, the other below. The Oxford EDS system is included. This S-4700 II is fully refurbished and operational at our Tustin, CA facility.OEMモデルの説明
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.ドキュメント
ドキュメントなし