説明
説明なし構成
Vacuum type：Oil pump*1, TMP*1 stage type：3 axes motorized stage PS/OS：Windows XP Detector：Upper secondary electron detector, Lower secondary electron detector UI：Operation2.7 EDS：Model HORIBA EDS 7593-H Resolution 137eV Det.Area 10mm2OEMモデルの説明
The S-4800 is an advanced Field Emission Scanning Electron Microscope (FE-SEM) that builds upon the proven performance of its predecessors, the S-4700 and S-5200. With beam deceleration technology, it achieves an impressive resolution of 1.4 nm at 1 kV and 1.0 nm at 15 kV. The microscope features a semi-in-lens detector design, allowing for the examination of large samples without compromising ultra-high resolution at low accelerating voltages. The innovative objective lens design incorporates Hitachi's Super ExB filter technology, which effectively separates pure secondary electrons (SE), compositional SE, and backscattered electron (BSE) signals. With a specimen diameter of 200 mm and a 5-axis motorized eucentric stage, it offers exceptional sample accommodation and positioning capabilities. The S-4800 is compatible with optional accessories such as Energy Dispersive X-ray Spectrometer (EDX) and Electron Backscatterted Diffraction Pattern (EBDP) systems, making it suitable for a range of ultra-high resolution applications in fields like semiconductor research, materials studies, and nanotechnology.ドキュメント
ドキュメントなし
HITACHI
S-4800
検証済み
カテゴリ
SEM
最終検証： 29日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Running
製品ID：
107210
ウェーハサイズ：
不明
ヴィンテージ：
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
HITACHI
S-4800
カテゴリ
SEM
最終検証： 29日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Running
製品ID：
107210
ウェーハサイズ：
不明
ヴィンテージ：
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
Vacuum type：Oil pump*1, TMP*1 stage type：3 axes motorized stage PS/OS：Windows XP Detector：Upper secondary electron detector, Lower secondary electron detector UI：Operation2.7 EDS：Model HORIBA EDS 7593-H Resolution 137eV Det.Area 10mm2OEMモデルの説明
The S-4800 is an advanced Field Emission Scanning Electron Microscope (FE-SEM) that builds upon the proven performance of its predecessors, the S-4700 and S-5200. With beam deceleration technology, it achieves an impressive resolution of 1.4 nm at 1 kV and 1.0 nm at 15 kV. The microscope features a semi-in-lens detector design, allowing for the examination of large samples without compromising ultra-high resolution at low accelerating voltages. The innovative objective lens design incorporates Hitachi's Super ExB filter technology, which effectively separates pure secondary electrons (SE), compositional SE, and backscattered electron (BSE) signals. With a specimen diameter of 200 mm and a 5-axis motorized eucentric stage, it offers exceptional sample accommodation and positioning capabilities. The S-4800 is compatible with optional accessories such as Energy Dispersive X-ray Spectrometer (EDX) and Electron Backscatterted Diffraction Pattern (EBDP) systems, making it suitable for a range of ultra-high resolution applications in fields like semiconductor research, materials studies, and nanotechnology.ドキュメント
ドキュメントなし