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HITACHI SU-70
    説明
    ANALYTICAL EQUIPMENT
    構成
    Imaging: 1.0nm at 15kV WD 4mm 1.6nm at 1kV 1.5mm deceleration mode 2.5nm at 1kV 1.5nm standard mode Magnification: Low Mag mode: 25 – 2,000x High Mag mode: 100- 800,000x Electron Optics: ZrO/W Schottky emission Probe current >200nA at 30kV Specimen Stage: 5 Axis motorization, X: 110mm, Y: 110mm, Z: 1.5 – 40mm, T: -5 to +70, R: 360 deg 150 mm Load Lock
    OEMモデルの説明
    Analytical UHR Schottky Emission Scanning Electron Microscope Model SU-70 is a new-concept SEM, incorporating Hitachi’s field proven semi-in-lens technology for ultra-high resolution with a Schottky electron gun. It features not only ultra-high resolution (1.0nm/15kV, 1.6nm/Kv (*)) but also reduced charge-up imaging, compositional-contrast imaging, and ultra-low voltage imaging derived from Hitachi’s highly reputed Super ExB filter technology. The Schottky electron gun enables a wide variety of analytical capabilities due to its high probe current (100nA).
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    HITACHI

    SU-70

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    検証済み

    カテゴリ

    SEM
    最終検証: 60日以上前
    主なアイテムの詳細

    状態:

    Refurbished


    稼働ステータス:

    不明


    製品ID:

    36388


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明

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    同様のリスト
    すべて表示
    HITACHI SU-70
    HITACHISU-70SEM
    ヴィンテージ: 0状態: 改修済み
    最終確認60日以上前

    HITACHI

    SU-70

    verified-listing-icon

    検証済み

    カテゴリ

    SEM
    最終検証: 60日以上前
    listing-photo-bbb7d005085e4963a834569a845d73cd-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Refurbished


    稼働ステータス:

    不明


    製品ID:

    36388


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    ANALYTICAL EQUIPMENT
    構成
    Imaging: 1.0nm at 15kV WD 4mm 1.6nm at 1kV 1.5mm deceleration mode 2.5nm at 1kV 1.5nm standard mode Magnification: Low Mag mode: 25 – 2,000x High Mag mode: 100- 800,000x Electron Optics: ZrO/W Schottky emission Probe current >200nA at 30kV Specimen Stage: 5 Axis motorization, X: 110mm, Y: 110mm, Z: 1.5 – 40mm, T: -5 to +70, R: 360 deg 150 mm Load Lock
    OEMモデルの説明
    Analytical UHR Schottky Emission Scanning Electron Microscope Model SU-70 is a new-concept SEM, incorporating Hitachi’s field proven semi-in-lens technology for ultra-high resolution with a Schottky electron gun. It features not only ultra-high resolution (1.0nm/15kV, 1.6nm/Kv (*)) but also reduced charge-up imaging, compositional-contrast imaging, and ultra-low voltage imaging derived from Hitachi’s highly reputed Super ExB filter technology. The Schottky electron gun enables a wide variety of analytical capabilities due to its high probe current (100nA).
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    HITACHI SU-70
    HITACHI
    SU-70
    SEMヴィンテージ: 0状態: 改修済み最終検証: 60日以上前