説明
REVIEW SEM構成
HD2700-BOEMモデルの説明
The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user's effort in doing aberration correction. Large solid-angle EDS* and atomic-spatial-resolution EDS* and EELS spectrum imaging* are enabled.ドキュメント
ドキュメントなし
HITACHI
HD-2700
検証済み
カテゴリ
SEM
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
82630
ウェーハサイズ：
不明
ヴィンテージ：
2010
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
HD-2700
検証済み
カテゴリ
SEM
最終検証： 17日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
82630
ウェーハサイズ：
不明
ヴィンテージ：
2010
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
REVIEW SEM構成
HD2700-BOEMモデルの説明
The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user's effort in doing aberration correction. Large solid-angle EDS* and atomic-spatial-resolution EDS* and EELS spectrum imaging* are enabled.ドキュメント
ドキュメントなし